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Materials and Device Characterization

  Materials and Device Characterization
  We offer access to a wide range of characterization techniques for materials and devices; optic microscopy, high resolution scanning and transmission electron microscopy, x-ray diffraction, scanning probe techniques and a variety of electric, optic and magnetic characterization of materials, structures and devices.
 
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(Extract from LIMS)
 
 NameManufacturerModel
DetailsM07 Olympus/cameraOlympusMicroscope
DetailsLEITZLEITZ MPV-SPThin film interferometry,
DetailsDektakSTDektak3ST
DetailsM01 OlympusOlympusBX60M
DetailsM02 Olympus/cameraOlympusBX60
DetailsM03 LeicaLeicaMicroscope
DetailsUVO CleanerJelight COmpany, Inc42-220
DetailsCD SEMHitachiS-3400N & EDS QUANTAX 200
Details4-PointFour Dimensions, IncModel 280
DetailsTencor P10TencorSurface profiler Tencor-P10
DetailsM11 Nikon/CD 1NikonOPTISHOT/Linjebreddsmätare
DetailsM10 Nikon/autoNikonMicroscope (motorized objectives)
DetailsManual probstationSuss Microtech10500006 (probe station)
DetailsUVISELHORIBAUVISEL ER
DetailsAFM AcreoDigital Instruments (Veeco)Atomic Force Microscope
DetailsM04 LeitzLeitzLABORLUX 12 HL
DetailsM05 Nikon/autoNikonMicroscope
DetailsHR X-RayX-RayX-Ray
Details3D MF ProbestationIn-houseMedium Field MR and RF Probe Station
DetailsHF ProbestationIn-houseHigh Field RF Characterization Station
DetailsCanon EOS 350DCanonEOS 350D 100mm Macro
DetailsAtomic Absorption SpectrometerThermco FisherThermo iCE 3000
DetailsTwo speed grinder-polisherBUEHLERAlpha
DetailsPrecision ion polishing systemGatanmodel 691
DetailsFreeze DryerIlshin LabIlshin
DetailsDifferential scanning calorimetry (DSC)TA Instruments2920 modulated DSC
DetailsRotational ViscometerAnton PaarVisco QC 100
DetailsThermogravimetry Analysis (TGA)TA InstrumentsTGA Q500
DetailsUV-Vis-NIR SpectrometerPerkin ElmerLambda-750
DetailsPotentiostat / Galvanostat - ZRAGAMRY InstrumentsVistsShield/Interface 1010
DetailsFE-TEMJEOLJEM 2100F(HR), JEOL Electron Microscope 2100 Field
DetailsFIB-SEMFEIQUANTA 3D FEG
DetailsGeminiZeiss Ultra 55
DetailsPreparation labCollection of toolsTools for sample preparation
DetailsPlasma cleanerFischionePlasma cleaner
DetailsGold sputter FNMJEOLIon sputter JFC-1100
DetailsDiamond sawBuehlerIsomet low speed saw
DetailsGrinder-polisherBuehlerVector/Alpha
DetailsUltrasonic disc cutterGatanModel 601
DetailsDimple grinderGatanDimple grinder
DetailsElectrolyte polishingFischioneElectrolyte polishing
DetailsIon polishingGatanPrecision ion polishing 691
DetailsM20 MicroscopeNanometricsMicroscope
DetailsLaboratory ovenHereausBench oven
DetailsProbestation 3 Semi AutomaticCascade MicrotechCascade 12000
DetailsProbestation 4 High Temp.SignatoneS-1060
DetailsProbestation 1 ManualCascade11000
DetailsPrometeus manualKarl Suss and Temptronic TermoChuck SystemManual Probestation PM 5, TP0314A
DetailsCryogenic ProbestationJanisST-500-UHT
DetailsFTIR SpectrometerBrukerVortex 70 V
DetailsPrometeus autoKarl Suss and Temptronic TermoChuck SystemAutomatic Probestation PA 150 and TP03215B-3300-2
DetailsSkivthkMitutoyoRDP transducer indicator E307-1
DetailsFTP500FTPInterferometer
DetailsKemvåg??
DetailsMS02 NikonNikonStereo microscope SMZ-2T
DetailsM13 Nikon/cameraNikonNikon
DetailsM08 Leitz/cameraLeitzMicroscope with camera
DetailsM09 Nikon/cameraNikonMicrosocpe with camera
DetailsMS01 NikonNikonStereo microscope SMZ-2B
DetailsM14 Olympus/cameraOlympusBX60
DetailsTesttool ElectrumElectrum labmodel 1
DetailsAFM/SSRMVeeco/Digital InstrumentsNanoScope Dimension 3100
DetailsOpt. micr. 1, AlbanovaNikonME600
DetailsOpt. micr. 2, AlbanovaNikonME600
DetailsOpt. micr. 3, AlbanovaNikonEclipse L200
DetailsOpt. micr. 4, fluorescence, AlbanovaNikonME600 w. fluorescence unit
DetailsOpt. Profiler AlbanovagbsSmartVIS 3D
DetailsMicrowave/THz Probe StationMSTMST Lab
DetailsZVA-24 Vector Network AnalyzerMSTMST Lab
DetailsDynatronix Pulse Power SupplyDynatronixDuPR10-.1-.3XR
DetailsPXINational InstrumentsNI PXI-1033 Series
DetailsRF Probe StationMSTMST Lab
DetailsCIPTSmartipCIPTech
DetailsAGMPrinceton Measurement Corporation2900-02 Alternating Gradient Magnetometer
DetailsProfiler AlbanovaKLA-TencorP7
DetailsAFM/SPM Nanow.JPK2 AlbanovaJPK InstrumentsNanowizard 3
DetailsSPM/AFM FastScan AlbanovaBrukerDimension FastScan
DetailsSPM/AFM Nanowizard JPK AlbanovaJPK InstrumentsNanowizard 3 Bioscience AFM
DetailsAFM/SPM CellKraft Humidifier AlbanovaCellKraftP2
DetailsAFM/SPM IPS Bipotentiostat AlbanovaIPSPGU-BI 1000
DetailsSPM/AFM Icon AlbanovaBrukerDimension Icon
DetailsBond Tester DAGEDAGE2400PC
DetailsEmpyreanPANalytical B.V.Empyrean multipurpose high resolution X-ray diffra
DetailsTencor P15TencorSurface profiler Tencor-P15
DetailsVT STMOmicronOmicron VT-STM
DetailsSTM 1OmicronOmicron STM-1
DetailsUHV SPM 3500RHK TechnologyUHV SPM 3500
DetailsRaman Spectrometer HORIBA iHR 550HORIBA Jobin YvoniHR 550
DetailsFIB/SEM AlbanovaFEI CompanyNova 200
DetailsHallVarian/KeithlyIn-house
DetailsBaltazar spectrometerSPECS GmbH and homemadeHomemade
DetailsScanning near-field optical microscope (SNOM)Max Born Institute with modifications at KTHA home-made instrument
DetailsParticle sizer-DLS/Zeta potentialBeckman CoulterDelsa Nano
DetailsGas Gromatography /Mass Spectrometry (GC/MS)Hewlett PackardHP 6890
DetailsCentrifuge Z 200 AHERMLEZ 200 A
DetailsFluorescence Spectrometer (PL)Perkin ElmerLS55
DetailsFourier Transform Infrared (FTIR)Thermo ScientificNicolet iS10
DetailsInductively Coupled Plasma Emission Spectrometry (ICP-OES)Thermo ScientificiCAP 6500
DetailsIon Chromatography (IC)MetrohmEco IC
DetailsMulti vessel dip coating unitAoxicindiaXdip.MVI
DetailsRotavapor BÜCHIR-205
DetailsOptical microscope (Leica)LEICA DMLMLeica
DetailsTGA/FTIR InterfaceThermo Scientific--
DetailsUEMJEOL JEM-2100Ultrafast Electron Microscopy
DetailsCnCVSEMILAB210
DetailsSheet Resistance 4 point MapperMDCSR2000N
DetailsTheta LiteMSTMST lab
DetailsKeithley ParameteranalyserTektronix4200A-SCS
DetailsOptical profilometerVeecoWyko NT9300
DetailsFrejaHitachiSU8230
DetailsEDSHitachiSU8230

 

2020-06-30 Quality group (P)